OPI-530 (High Power LE Test System)

LD

OPI-530 (High Power LE Test System)

This equipments is able to measure optical / electrical characteristics for LD module simultaneously depending on ambient temperature

Jig for controling temperature of sample

Integrated measurement for the optical/electrical characteristics

• It automatically performs all measurement conditions set for temperature, luminous, electricity serially only by one click
• Category of laser diodes to be possibly measured: DIL(Dual in Line), Mini-DIL, 13-pin/14-pin Butterfly, 20-pin/26-pin Butterfly
• Measurement items - Total spectrum pulse for laser diode
  - Environment and temperature for LD/Measurement
  - Supply current, luminous intensity and internal current value for PD
  - Supplying bias value for internal PD / Measurement, storing PD gain and Offset in PD
  - LD Peak Pluse, Current/Voltage/Measuring position of Kink which is
  - Slope Efficiency, Threshold, Driving voltage graph depending on current increase, 1st differential graph, luminious intensity graph, internal PD current graph, Sweep graph
• Slow Current Increment / Decrement functions for preventing damages due to surge current in LD package

Integrating sphere system for measuring optical	This equipment is able to set measurement procedure	Instantly generate various report formats using Excel templates

Measurement for L-I-V of LD depending on ambient temperature

• It is able to measure optical / electrical characteristics for sample by changing temperature between 0°C ~ 80°C [Temperature resolving power:0.01°C]
• Current supplying and measurement is available for up to 5A(for 2440)
• It uses 2 inch integrating sphere system for LD optical input and LD mount for controling LD package temperature and power supplying

Measurement result screen for L-I-V Sweep	Front Panel Mode individuaily drives each condition

PD color correction

• It uses PD color correction index in order to get exact reaction value for PD by finding exact color range of LD in connection with Spectrum Analyser

Optimized for measuring R&D and reliability

• Current - voltage - Luminous sweep measurement
• It is possible to measure objects for R&D immediately using Front Panel mode
• Measurement for optical / electrical characteristics depending on temperature
• Various power supply and measurement ranges are selectable using Keithley Sourcemeter
• Various custom - tailored adaptors
• Special functions can be added based on customer request (option)

Story Mode

• This mode stores various measurement conditions on custom based making it possible to measure various LD package.
• Various temperature conditions are stored, and measurement is performed on those conditions.

Report generation

• Measurement result can be stored as CSV and other formats, and this function is able to export the result by Excel, and thus generate reports by integrating data on Excel template based on user requirement
• It is able to edit location of measurement items by fitting various items to template

Exact and stabilized measurement

• Providing standard measurement mode of International Commission on Illumination and KS
• Correction agent of Korea Reserch Institute of Standards and Science (KRISS) (Optional)

Technical support and A/S

• User oriented setup and user guide
• Software development based on customer requirement
• Providing new measurement method and information via LED standard consortium and International Commission on Illumination and Luminous intensity measurement club activities
• Rapid A/S
• Support for JIG to help various sample measurement